- All sections
- G - Physics
- G01R - Measuring electric variablesmeasuring magnetic variables
- G01R 1/073 - Multiple probes
Patent holdings for IPC class G01R 1/073
Total number of patents in this class: 2417
10-year publication summary
119
|
161
|
198
|
209
|
242
|
241
|
214
|
256
|
221
|
144
|
2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
Owner |
All patents
|
This class
|
---|---|---|
Technoprobe S.p.A. | 149 |
125 |
Kabushiki Kaisha Nihon Micronics | 393 |
120 |
Taiwan Semiconductor Manufacturing Company, Ltd. | 42863 |
86 |
NHK Spring Co., Ltd. | 1864 |
85 |
Tokyo Electron Limited | 12751 |
76 |
FormFactor, Inc. | 287 |
64 |
MPI Corporation | 138 |
57 |
Nidec-Read Corporation | 166 |
52 |
Japan Electronic Materials Corp. | 65 |
51 |
Advantest Corporation | 1809 |
46 |
Intel Corporation | 47013 |
44 |
Chunghwa Precision Test Tech Co., Ltd. | 55 |
43 |
Point Engineering Co., Ltd. | 267 |
43 |
Samsung Electronics Co., Ltd. | 146534 |
42 |
Yokowo Co., Ltd. | 539 |
39 |
Microfabrica Inc. | 121 |
36 |
Leeno Industrial Inc. | 86 |
30 |
International Business Machines Corporation | 61287 |
28 |
Johnstech International Corporation | 144 |
26 |
Texas Instruments Incorporated | 19448 |
25 |
Other owners | 1299 |